Perform wafer probing, testing and failure analysis from -65° to +400°C. Test wafers up to 300mm diameter at precise temperature at the wafer probing station.
Model TP03500
200mm or 300mm
200°C or 300°C
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Model TP03000A-65°C to +200°C
Model TP03010A/B
A: +20°C to +200°C
B: 0°C to +200°C
Model TP03015
A: +30°C to +300°C
B: 0°C to +300°C
Model TP0315A/B
Custom Thermal Chambers, Thermal Platforms, and Portable Temperature Sources.
Temperature conditioning systems for front and back-end testing applications.
Process Chillers and Thermal Engines for Industrial temperature applications.